Ilim ha’m ja’miyet Issue 5-1 (2024) · pp. 26-27

KISLORODLI MONOKRISTALLI KREMNIYNI RENTGENOSTRUKTURAVIY OʻRGANISH

Maxmudov, Sh.A., Jurayeva, M.F., Jalelov, M.A., Odilova, N.J.

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Abstract

In the article, single-crystal silicon having a perfect structure with a lattice parameter of 0,54292 nm and subcrystallites with a size of 94 nm was studied and determined the formation of low-dimensional defects consisting with the participation of oxygen in silicon grown by the Czochralski method.

monokristallkremniymikronuqsonlarkislorod konsentratsiyasirentgenografiyabir xilmaslikмонокристаллкремниимикродефектыконцентрация кислорода

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Cite

APA 7 
Maxmudov, Sh.A., Jurayeva, M.F., Jalelov, M.A. & Odilova, N.J. (2024). KISLORODLI MONOKRISTALLI KREMNIYNI RENTGENOSTRUKTURAVIY OʻRGANISH. Ilim ha’m ja’miyet, (5-1), 26-27.
GOST R 7.0.5 
Maxmudov, Sh.A., Jurayeva, M.F., Jalelov, M.A., Odilova, N.J. KISLORODLI MONOKRISTALLI KREMNIYNI RENTGENOSTRUKTURAVIY OʻRGANISH // Ilim ha’m ja’miyet. 2024. № 5-1. С. 26-27.
BibTeX 
@article{sh.a.2024,
  author  = {Maxmudov, Sh.A. and Jurayeva, M.F. and Jalelov, M.A. and Odilova, N.J.},
  title   = {KISLORODLI MONOKRISTALLI KREMNIYNI RENTGENOSTRUKTURAVIY OʻRGANISH},
  journal = {Ilim ha’m ja’miyet},
  year    = {2024},
  number  = {5-1},
  pages   = {26-27}
}
RIS 
TY  - JOUR
AU  - Maxmudov, Sh.A.
AU  - Jurayeva, M.F.
AU  - Jalelov, M.A.
AU  - Odilova, N.J.
TI  - KISLORODLI MONOKRISTALLI KREMNIYNI RENTGENOSTRUKTURAVIY OʻRGANISH
JO  - Ilim ha’m ja’miyet
PY  - 2024
IS  - 5-1
SP  - 26
EP  - 27
ER  -